K9F2G08U0M datasheet, K9F2G08U0M pdf, K9F2G08U0M data sheet, datasheet, data sheet, pdf, Samsung Electronic, FLASH MEMORY. K9F2G08U0M Datasheet PDF Download – FLASH MEMORY, K9F2G08U0M data sheet. The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications.

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Flow chart to create invalid block table.

The on-chip write controller dagasheet all program and erase functions including pulse repetition, where required, and internal verification and margining of data. An invalid block s does not affect the performance of valid block s because it is isolated from the bit line and the datasheeet source line by a select transistor. Random page address programming is prohibited.

The Erase Confirm command D0h following the block address loading initiates the internal erasing process.

The serial data loading period begins by inputting the Serial Data Input command 80hfollowed by the five cycle address inputs and then serial data loading. Five read cycles sequentially output the manufacturer code EChand the device code and XXh, 4th cycle ID, 50h respectively. VIL can undershoot to The device may include invalid blocks when first shipped. RE or CE does not need to be toggled for updated status. Its value can be determined by the following guidance. Serial access may be done datsheet power-on without latency.


Line Protection, Backups BX When low, it indicates that a program, erase or random read operation is in process and returns to high state upon completion. A read operation with “35h” command and the address of the source page moves the whole byte X8 device or word X16 device data into the internal data buffer.

This operation is also initiated by writing 00hh to the command register along with five k9f22g08u0m cycles. Figure 14 shows the operation sequence. An internal voltage detector enables auto-page read functions when Vcc reaches about 1.

(PDF) K9F2G08U0M Datasheet download

The words other than those to be programmed do not need to be loaded. The device may output random data in a page instead of the consecutive sequential data by writing random data output command. When you place an order, your payment is made to SeekIC and not to your seller. A block consists of two NAND structured strings. The Page Program confirm command 10h initiates datasgeet programming process.

It is an open drain output and does not float to high-z condition when the chip is deselected or when outputs are disabled. In addition, for voice or audio applications which use slow cycle time on the order of u-seconds, de-activating CE during the data-loading and serial access would provide significant k9t2g08u0m in power consumption.

During transitions, this level may undershoot to You may also be interested in: Refer to table 2 for specific Status Register definitions.

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K9F2G08U0 datasheet & applicatoin notes – Datasheet Archive

Some other commands, like page read and block erase and page program, require two cycles: At the rising edge of WE after the erase confirm command input, the internal write controller handles erase and erase-verify. AC Waveforms for Power Transition 1. Since the time-consuming serial access and k9d2g08u0m cycles are removed, system performance for solid-state disk application is significantly increased. Any intentional erasure of the original invalid block information is prohibited.

This two-step sequence of setup followed by execution command ensures that memory contents are not accidentally erased due to external noise conditions. It is possible to write data into the cache registers while data stored in data registers are being programmed into memory cells in cache program mode.

K9F2G08U0M Datasheet PDF

Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. We will also never share your payment details with your seller. Therefore, if the status register is read during a random read cycle, the read command 00h should be given before starting read cycles.

The number of consecutive partial page programming operation within the same page without an intervening erase operation must not exceed 4 times for main array X8 device: